Scanning Electron Microscope with EDS detector
Manufacturer and type
Tescan, Czech Republic, FE-SEM, Mira II LMU;
Location
Department of Textile Chemistry and Ecology
Contact person:
Prof. Sandra Bischof, PhD
sbischof@ttf.unizg.hr
Application:
A scanning microscope with an FE (field emission) electron source enables high-resolution image of the object. It is equipped with several detectors: secondary electron detector (SE), backscattered electron detector (BSE), detector for higher resolution of very short working distances (In-beam SE), X-ray detector for elemental analysis (EDS), detector for the analysis of electric currents in semiconductors, e.g. integrated circuits, solar cells, etc. (EBIC), and a detector which acquires TEM comparable images by using a SEM microscope (STEM). The microscope can operate in low vacuum conditions thus preventing the surface electrostatic charge of the sample. It has a wide range of applications in technical and natural sciences with regard to application in topography and morphology analysis of sample surfaces, particle size distribution, determination of sample dimensions and homogeneity, mechanical and chemical damage to materials and their chemical composition.
Technical characteristics:
- Resolution: 1.0-3.0 nm
- Magnification: 4 x-1.000.000 x
- Electron gun: High brightness Schottky emitter
- Scanning features: Dynamic focus, Point and Line scan, 3D Beam
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